Electron microscopy
 
Analysis of Crystal Deformation/Distortion
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

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In general, both single-crystal XRD and conventional electron diffraction (ED) techniques are not sensitive enough to small crystal deformations. For such deformations, high-resolution powder XRD using synchrotron radiation can be a more sensitive and reliable technique. For instance, a distortion from cubic symmetry to tetragonal or orthorhombic (hexagonal or trigonal) symmetries should result in splitting of some peaks. Even very small distortions can often be observed with systematic peak broadening in high-resolution powder XRD patterns.

 

 

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