Sample Damage in TEM Measurements
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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TEM (transmission electron microscope) specimens can be damaged by the high-energy electron beam during observation. Therefore, it is important to recognize the effects of damage produced by the beam in TEM. These damages can be studied by monitoring the change of crystalline morphology using electron diffraction or high-resolution imaging, or by the extraction of specimen thickness, chemical composition, or electronic states from the changes in EELS features.

 

 

 

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