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Integrated reflection coefficient in TEM is the ratio of the integrated scattered beam intensity to the initial beam intensity received by a real crystalline sample from the incident beam in a real electron scattering measurement. In the case of X-ray diffraction measurements, the beam is X-ray instead of incident electrons.
For instance, in the kinematic theory of electron scattering, the integrated reflection coefficient is given by,
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where,
L -- The Lorentz factor in unit of
length,
I0 -- The intensity of the incident electron beam,
S -- The illuminating area by the incident electron beam,
Φhkl -- Fourier coefficients of an electrostatic potential,
Fhkl -- The structure factors,
A -- The thickness of the crystal in the TEM specimen,
σ -- The interaction constant between the incident electrons and specimen,
Θ -- The half of the angle between the transmitted and scattered electron beams,
ξhkl -- The extinction distance.
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