This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
The main methods for indirect aberration corrections are:
Those two techniques measure the exit wave function in the image plane, ψim(g), and then restore the exit wave in the object plane, ψobj(g), by applying a numerical phase-plate exp(-2πiχ(g)). The aberration function χ(g) is determined independently. [6, 7] The restored exit wave in the object plane can provide atomic structure information without delocalization and better information limit.
i) High-resolution electron holography, [1,2]
ii) Through-focus series reconstruction. [3 - 6]
 Lichte, H. (1986). Electron holography approaching atomic resolution.
Ultramicroscopy 20, 293–304.
 Tonomura, A. (1993). Electron Holography. Berlin: Springer.
 Coene, W. & Jansen, A.J.E.M. (1992). Image delocalisation and
high resolution transmission electron microscopic imaging with
a field emission gun. Scan Microsc 6 (Suppl.), 379–403.
 Coene, W.M.J., Thust, A., Op de Beeck, M. & Van Dyck, D. (1996). Maximum-likelihood method for focus-variation image
reconstruction in high resolution transmission electron
microscopy. Ultramicroscopy 64, 109–135.
 Saxton, W.O. (1994). What is the focus variation method? Is it
new? Is it direct? Ultramicroscopy 55, 171–181.
 Thust, A., Overwijk, M.H.F., Coene, W.M.J. & Lentzen, M. (1996). Numerical correction of lens aberrations in phase retrieval
HRTEM. Ultramicroscopy 64, 249–264.
 Lehmann, M. (2000). Determination and correction of the coherent
wave aberration from a single off-axis electron hologram by
means of a genetic algorithm. Ultramicroscopy 85, 165–182.