Energy Filter Applied to Observation of
Thermal-diffuse Streaks in Electron Diffractions
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


There is a contribution of inelastically scattered electrons to the conventional electron diffraction patterns (refer to thickness dependence and atomic number dependence) so that the Bragg spot intensity, especially of weak reflections, and the thermal-diffuse streaks caused by electron–phonon scattering can be enhanced by the zero-loss filtering.




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