Electron microscopy
Applications of EELS Technique
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Table 3168a list the applications of EELS technique. These various characteristics are obtained in different energy regions depending on the energy lost.

Table 3168a. Applications of EELS technique.

Plasmon energy
Valence-electron density, dielectric response/function
Plasmon peak shift
Alloy composition, crystalline phase
Low-loss intensity
Local thickness, mass thickness
Low-loss fine structure
Band gap, dielectric function, JDOS, electronic structure
Low-loss fingerprinting
Phase identification
Core-loss intensities
Elemental analysis
Near-edge fine structure ()
Oxidation state, valency
L- or M-white-line ratio
Valency, magnetic properties
Extended fine structure (EXELFS)
Interatomic distances, electronic structure, nearest neighbor distributions, coordination numbers
Bethe ridge (ECOSS)
Bonding state
Atomic site location

Table 3168b. Comparison of different EELS techniques.
VEELS (1~tenths of eV)
(core loss)
Interband transition
Intraband transition
Surface plasmons
Interface plasmons
Volume plasmons
Complex dielectric function
Chemical composition
Bonding information
Local coordination
Local electronic properties