Electron microscopy
 
Yield of Backscattering Electrons in EM
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        


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Figure 1162 shows the yields of secondary and backscattered electrons, and their sum as a function of the accelerating energy of incident electrons in an electron microscope.

Yields of secondary and backscattered electrons, and their sum as a function of the accelerating energy of incident electrons in an electron microscope

Figure 1162. Yields of secondary and backscattered electrons, and their sum as a function of the accelerating energy of incident electrons in an electron microscope.


 

 

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