Elastic-Inelastic Multislice Simulation for EELS - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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Bulk plasmon scattering cross section generated by fast electrons can be simulated by Algortihm for Elastic-Inelastic Multislice Method using Monte Carlo application. [1] Such simulation can be used to obtain:
[1] Mkhoyan, K. A.; Babinec, T.; Maccagnano, S. E.; Kirkland, E. J.; Silcox, J.,
Separation of bulk and surface-losses in low-loss EELS measurements in
STEM. Ultramicroscopy 2007, 107, 345-355.
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