Strain/Stress Analysis using EBSD - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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High-resolution EBSD enables the measurement of strain with good sensitivity. [1-4] In this case, the strain is measured relative to a reference strain-free area.
[1] Wilkinson AJ, Meaden G, Dingley DJ, High resolution mapping of strains and rotations
using electron backscatter diffraction. Mater Sci Technol 22:1271–1278, (2006).
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