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EELS Artifacts - Practical Electron Microscopy and Database - - An Online Book - |
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| Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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Elastic scattering artifacts can dominate EELS spectrum images when the collection angle is much smaller than the incident probe angles. [1]
[1] M. Bosman, et al., Phys. Rev. Lett. 99, 086102 (2007).
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