Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
Optimal Electron Microscopy (EM) Conditions
| There are few possibilities to optimize the conditions of data acquisition and analysis of
electron microscopy (EM):
i) Match the maximum allowed electron dose on the specimen, the magnification, and the sensitivity of the recording medium.
ii) Increase the maximum electron dose that the EM specimen can withstand:
ii.a) Use cryomicroscopy with liquid nitrogen to cool down the specimen in order to reduce irradiation damage.
iii) Optimize the beam voltage (contrast falls at high energy, but spatial resolution is better). 200-300keV is a likely optimum.
iv) Maximize the contrast or the signal; for a given
experiment, BF (Bright Field) or DF (Dark Field), CTEM or STEM may
be best, but there is no clear winner that can always provide the best option.
v) Use image processing to reduce the effects of noise.
|
