Electron microscopy
 
Comparison between Low- and High-Voltage (S)TEM Measurements
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Table 1267. Comparison between low- and high-voltage (S)TEM measurements.

  Low-voltage (S)TEM High-voltage (S)TEM
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Knock-on damage
Weaker Stronger
Beam energy
Only good to see through thin specimens or liquids Good to see through thick specimens or liquids
Growth of nanocrystals
Does not induce the growth of the nanocrystals at 80 kV and the electron dose of 3.9 x 103 e-2 [1] Induces the growth of the Ag nanocrystals at 300 kV and the electron dose of 3.9 x 103 e-2 [1]

 

 

 

 

 

 

 

 

[1] Frances M. Ross, Liquid Cell Electron Microscopy, 2017.

 

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