Electron microscopy
 
Accuracy of CBED Patterns
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        


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Due to the distortions inherent in electron lenses, it is important to calibrate the CBED patterns by comparing an unknown pattern from a known structure with standard diffraction angles. A difference of 10% or more is common at large angles, so that angular measurements taken from CBED patterns may contain such error. Therefore, a correcton table needs to be obtained for particular lens currents.

 

 

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