Charge-Flipping Algorithm - Practical Electron Microscopy and Database - - An Online Book - |
||||||||
Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
================================================================================= | ||||||||
Accurate structure factor intensities can be obtained for all reflections from single crystal X-ray diffractions. Determination of crystal structure factor phases can be done through direct methods, Patterson method, charge-flipping algorithm or maximum entropy method, in combination with single crystal X-ray diffraction. The overlapping problem of powder X-ray diffraction (PXRD) can be partially solved through the fast iterative Patterson squaring (FIPS), [1] repartitioning by histogram matching in a charge-flipping algorithm [2] or other methods.
[1] M. A. Estermann, L. B. McCusker and Ch. Baerlocher, J. Appl.
Crystallogr., 1992, 25, 539; M. A. Estermann and V. Gramlich, J. Appl.
|
||||||||
================================================================================= | ||||||||
|
||||||||