Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| Accurate structure factor intensities can be obtained for all reflections from single crystal X-ray diffractions. Determination of crystal structure factor phases can be done through direct methods, Patterson method, charge-flipping algorithm or maximum entropy method, in combination with single crystal X-ray diffraction.
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