EELS Measurement of Lanthanum - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||||||||
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In routine EELS measurements, the major La (lanthanum) EELS edges used are M5 832 eV and M4 849 eV, and N4,5 99 eV as shown in Figure 1477a.
Other weaker edges of La are M3 1123 eV and M2 1204 eV, N1 270 eV and N2,3 191 eV as shown in Figure 1477b. Since those edges are very weak, they are not used usually.
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