Electron microscopy
 
EELS Measurement of Lanthanum
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In routine EELS measurements, the major La (lanthanum) EELS edges used are M5 832 eV and M4 849 eV, and N4,5 99 eV as shown in Figure 1477a.

EELS Measurement of Lanthanum
(a)
EELS Measurement of Lanthanum
(b)
Figure 1477a. Major La (lanthanum) EELS edges used in routine EELS measurements: (a) M5 832 eV and M4 849 eV (most often used) and (b) N4,5 99 eV.

Other weaker edges of La are M3 1123 eV and M2 1204 eV, N1 270 eV and N2,3 191 eV as shown in Figure 1477b. Since those edges are very weak, they are not used usually.

Other weaker edges of La: (a) M3 1123 and M2 1204
(a)
N1 270 eV
(b)
(c)
Figure 1477b. Other weaker edges of La: (a) M3 1123 and M2 1204, (b) N1 270 eV, and (c) N2,3 191 eV.

 

 

 

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