This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In kinematic approximation, by introducing a phase shift (α) at a stacking fault, the TEM imaging intensity (|A_g|²) is given by,

        -------------------- [1996a]
where,
          α -- (= 2πg·R) The phase shift at the stacking fault;
          R -- The displacement of the crystal below the stacking fault relative to that above it;
          s -- The deviation parameter;
          z -- The stacking fault depth.

Equation 1996a indicates that the visibility of the stacking fault is dependent on α, s, and z.