Advanced EM-related Measurements and Analyses: Challenges
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

Investigating individual point defects, e.g. monovacancies, using TEM-related techniques was believed to be difficult because this requires both atomic sensitivity and atomic resolution and the specimens need to be very thin such that one can detect the individual point defects from the image contrast.

The experimental conditions of the microscope are also very important for point defect analyses, for instance, a probe current, applied in a JEM-2100F equipped with a delta corrector and cold field emission gun operated at 60 kV, to analyze monovacancy in single-layered h-BN (hexagonal boron-nitride) by STEM-EELS was approximately 40 pA.

The emerging capability of EELS energy resolution is down to 200 meV or better.

 

 

 

=================================================================================

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.