Electron microscopy
 
Scanning Probe Microscopy (SPM)
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Scanning probe microscopes (SPMs) have become one type of the important tools in the investigation of local surface behavior. Depending on different applications, several SPM techniques have been developed, such as electric force microscopy, magnetic force microscopy, piezoresponse force microscopy (PFM), and scanning capacitance microscopy (SCM).

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.