Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| Scanning probe microscopes (SPMs) have become one type of the important tools in the investigation of local surface behavior. Depending on different applications, several SPM techniques have been developed, such as electric force microscopy, magnetic force microscopy, piezoresponse force microscopy (PFM), and scanning capacitance microscopy (SCM).
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