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SiSn
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Table 2391. Comparison of properties of crystalline and amorphous SiSn materials.
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Crystalline SiSn |
Amorphous SiSn |
Energy gap/Optical band gap Eg (eV) |
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1.50 for a-Si1-xSnx:H |
Urbach energy E0 (meV) |
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60 for a-Si1-xSnx:H |
Fermi level density of states g (EF) (cm-3eV-1) |
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1017 for a-Si1-xSnx:H |
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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