Zeiss Instruments
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Figure 2397 compares the two commercial fixed-beam energy filters (a typical Zeiss Ω filter and a typical Gatan filter) for energy selected imaging (ESI) in TEM columns. Both can be used in EFTEM imaging.

Schematic comparison between the Zeiss Ω filter (a) and the typical Gatan filter (b) for energy selected imaging (ESI) in TEM columns

Figure 2397. Schematic comparison between a typical Zeiss Ω filter (a) and a typical Gatan filter (b) for energy selected imaging (ESI) in TEM columns.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.