This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Due to elastic relaxation in thin TEM specimens, split HOLZ lines in CBED patterns are often observed.

Note that the accuracy of strain measurements by using CBED technique is affected by broadening and/or splitting of the HOLZ lines that is induced by curvature of atomic lattice.