Semiconductor Device Performances
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Many important structural parameters of materials can modify semiconductor device performance. These parameters include:
        i) The micro-structures, such as crystalline and amorphous phases,
        ii) The dimensions of multilayers,
        iii) The imperfections,
        iv) The chemical compositions, e.g. dopants.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.