X-ray Lines Used in XRD Analysis
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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It is very common that Cu X-ray lines are applied to X-ray diffraction (XRD) analysis. The X-ray wavelengths (λ) of Cu Kα1 and Cu Kα2 are 1.540598 Å and 1.544426 Å, respectively. The average wavelength of Cu Kα is 1.54278 Å.

 

 

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