Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| In STEM analysis, the effect of the beam–specimen interaction in modifying the probe wave function into the sample exit wave function can be modeled using either the Bloch wave approach [1,2] or a multislice approach. [3,4] In the Bloch waves approach, [1,2] one employs the fact that the eigenfunctions of electrons inside a crystalline solid are in the form of Bloch waves. Therefore, the modeling of the beam–sample interaction is converted into a problem of wave function matching at the entrance surface and at the exit surface. Such an approach is very useful for the interpretation of the HAADF-STEM images taken from perfect periodic structures, but is not applicable to accurately predict the HAADF-STEM images of real specimens because it cannot be easily applied to defects or surfaces.
[1] Nellist P, Pennycook SJ. Ultramicroscopy 1999;78:111–24.
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