Strain Measurement with NanoBeam Diffraction (NBD)
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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TEM NBD (nanobeam diffraction) is the most favorable technique for routine strain analysis due to simple experimental set-up, nano-meter spatial resolution and high measurement sensitivity (std. dev. ~ 0.1%). However, for strain measurements, NBD is normally performed in STEM line-scanning mode and thus strain mapping over large sample area can be time-consuming.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.