EELS Measurement of Helium (He)
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Different from EDS, EELS can provide elemental data on all the light elements except H and He, although the latter had been detected under certain conditions, e.g., in nanometer-sized He bubbles in irradiated Ni alloys [1].






[1] McGibbon, A.J. (1991) The application of PEELS on a STEM to the problem ofinert gas bubbles in solids. In F.J Humphreys, Ed., Proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, p. 109-1 12. Institute of Physics Conference Series no 1 19, Institute of Physics, Bristol.




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