This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The problem due to preferred orientation is serious in X-ray diffraction. Due to the preferred orientation some peaks can completely be missing and the intensity of some peaks can be very misleading. The preferred orientation also can substantially alter the appearance of the powder pattern. For instance, powder X-ray diffraction, due to the typical preferential orientation of the misfit compounds, gives a very partial information of the samples.