Phonon Effect on Electron Diffraction Patterns
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

=================================================================================

Phonon scattering contributes to the background of TEM images and diffraction patterns. However, because little information can be deduced from their intensity or angular distribution the formed phonons are rarely useful for detection in EMs.

 

 

=================================================================================

The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved