This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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In STEM measurements, the channelling effect induces the electrons in the probe to be periodically trapped by the attractive, periodic potential of the atoms in the crystal in the specimen. The process is similar to a fine waveguide. Due to the dynamical nature of the process the oscillating intensity of the electron wave on the atom sites with depth in the specimen is formed.