Diffraction Analysis in TEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. You can click How to Cite This Book to cite this book. Please let Dr. Liao know once you have cited this book so that the brief information of your publication can appear on the “Times Cited” page. This appearance can also help advertise your publication.

 

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Assuming [UVW] is the electron beam direction, the poles (plane normals) at the UVW zone axis represent the possible diffraction planes for this zone. Therefore, when [UVW] is in the center of the projection, all the hkl reflections should be around the circumference of the projection. This is the reason that electron stereographic projection can be used for interpretation of electron diffraction patterns and determination of crystalline orientations.

 

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