Noise Intensity of Diffractograms
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

=================================================================================

The noise intensity of diffractograms can be higher than the intensity of the Thon-ring signal itself. One of the reasons is due to the random distribution of the atom positions within amorphous objects.

 

 

 

=================================================================================

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.