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In electron holography, the specimen images are normally produced in two steps: i) Record interference fringes with an objective wave and a reference wave (hologram) as mentioned above; ii) Reconstruct the hologram using a light beam or a Fourier transformation [1].

[1] Y Y Wang, M. Kawasaki, J. Bruley, M. Gribelyuk, A. Domenicucci, and J. Gaudiello, Off-axis electron holography with a dual-lens imaging system and its usefulness in 2-D potential mapping of semiconductor devices. Ultramicroscopy 101: 63–72 (2004).