Measurement of Magnetic Field using Off-axis Electron Holography
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Research and engineering applications of off-axis electron holography can be split into three main categories:
         i) Correct microscope aberration to achieve high spatial resolution.
         ii) Measure electric fields in materials at high spatial resolution.
         iii) Measure magnetic fields at high spatial resolution.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.