Application of Aberration Corrections in EMs
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Additional capabilities of EMs can be obtained by using aberration correctors. For instance, the novel applications include low-kV microscopy [1 - 5], imaging and analytical in situ dynamic experiments [6 – 14], enhanced contrast and resolution in thick biological specimens [15 - 17], quantitative image analysis [18-20], atomic resolution spectroscopy [21 - 23], and three-dimensional (3D) atomic characterization [24 - 28], to name but a few.

 

[1] Botton, G. A., Lazar, S., & Dwyer, C. (2010). Elemental mapping at the atomic scale using low accelerating voltages. Ultramicroscopy. doi:10.1016/j.ultramic.2010.03.008.
[2] Jin, C., Suenaga, K., & Iijima, S. (2009). In situ formation and structure tailoring of carbon onions by high-resolution transmission electron microscopy. Journal of Physical Chemistry C, 113, 5043–5046.
[3] Krivanek, O. L., Dellby, N., Murfitt, M. F., Chisholm, M. F., Pennycook, T. J., Suenaga, K., et al. (2010). Gentle STEM: ADF imaging and EELS at low primary energies. Ultramicroscopy. doi:10.1016/j.ultramic.2010.02.007
[4] Suenaga, K., Sato, Y., Liu, Z., Kataura, H., Okazaki, T., Kimoto, K., et al. (2009). Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage. Nature Chemistry, 1, 415–418.
[5] Bell, D., Kolmykov, D., and Russo, C., (2011) Low-Voltage (40 kV) Aberration-Corrected, Monochromated, Imaging for Carbon Nanostructures, Microscopy and Microanalysis, 17, 1490-1491.
[6] Barwick, B., Park, H. S., Kwon, O.-H., Baskin, J. S., & Zewail, A. H. (2008). 4D imaging of transient structures and morphologies in ultrafast electron microscopy. Science, 322, 1227–1231.
[7] Baum, P., & Zewail, A. H. (2009). 4D attosecond imaging with free electrons: Diffraction methods and potential applications. Chemical Physics, 366, 2–8.
[8] De Graf, M. (2009). Recent progress in Lorentz transmission electron microscopy: Applications to multi-ferroic materials. European Symposium on Martensitic Transformations (ESOMAT), 2009, 01002. doi:10.1051/esomat/200901002
[9] Gai, P. L., & Boyes, E. D. (2009). Advances in atomic resolution in situ environmental transmission electron microscopy and 1Å aberration corrected in situ electron microscopy. Microscopy Research and Technique, 72, 153–164.
[10] King, W. E., Campbell, G. H., Frank, A., Reed, B., Schmerge, J. F., Siwick, B. J., et al. (2005). Ultrafast electron microscopy in materials science, biology, and chemistry. Journal of Applied Physics, 97, 111101.
[11] Stach, E. A. (2008). Real-time observations with electron microscopy. Materials Today, 11, 50–58.
[12] Tanase, M., & Petford-Long, A. K. (2009). In situ TEM observation of magnetic materials. Microscopy Research and Technique, 72, 187–196.
[13] Zewail, A. H. (2010). Four-dimensional electron microscopy. Science, 328, 187–193.
[14] Zewail, A. H., & Thomas, J. M. (2010). 4D electron microscopy: Imaging in space and time. Hackensack, NJ: Imperial College Press.
[15] Henderson, R. (2004). Realizing the potential of electron cryo-microscopy. Quarterly Review of Biophysics, 37, 3–13.
[16] Jensen, G. J., & Briegel, A. (2007). How electron cryotomography is opening a new window onto prokaryotic ultrastructure. Current Opinions in Structural Biology, 17, 260–267.
[17] Leis, A., Rockel, B., Andrees, L., & Baumeister, W. (2009). Visualizing cells at the nanoscale. Trends in Biochemical Sciences, 34, 60–70.
[18] Van Aert, S., den Dekker, A. J., & Van Dyck, D. (2004). How to optimize the experimental design of quantitative atomic resolution TEM experiments? Micron, 35, 425–429.
[19] Van Aert, S., den Dekker, A. J., Van Dyck, D., & van den Bos, A. (2002). High-resolution electron microscopy and electron tomography: Resolution versus precision. Journal of Structural Biology, 138, 21–33.
[20] Van Aert, S., Van Dyck, D., & den Dekker, A. J. (2006). Resolution of coherent and incoherent imaging systems reconsidered—classical criteria and a statistical alternative. Optics Express, 14, 3830–3839.
[21] Allen, L. J. (2008). Electron microscopy: New directions for chemical maps. Nature Nanotechnology, 3, 255–256.
[22] Muller, D. A. (2009). Structure and bonding at the atomic scale by scanning transmission electron microscopy. Nature Materials, 8, 263–270.
[23] Williams, D. B., & Watanabe, M. (2007). Progress of x-ray analysis in transmission electron microscopes from 1977 to 2007 and toward the future. Acta Microscopica, 16(Suppl. 2), 13–14.
[24] Bar Sadan, M., Houben, L., Wolf, S. G., Enyashin, A., Seifert, G., Tenne, R., et al. (2008). Toward atomic-scale bright-field electron tomography for the study of fullerene-like nanostructures. Nano Letters, 8, 891–896.
[25] Jinschek, J. R., Batenburg, K. J., Calderon, H. A., Kilaas, R., Radmilovic, V., & Kisielowski, C. (2008). 3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography. Ultramicroscopy, 108, 589–604.
[26] Midgley, P. A., & Dunin-Borkowski, R. E. (2009). Electron tomography and holography in materials science. Nature Materials, 8, 271–280.
[27] O’Keefe, M. A., Downing, K. H., Wenk, H.-R., & Meisheng, H. (2005). Atomic-resolution 3D electron microscopy with dynamic diffraction. Microscopy and Microanalysis, 11, 314–315.
[28] Van den Broek, W., Van Aert, S., & Van Dyck, D. (2009). A model based atomic resolution tomographic algorithm. Ultramicroscopy, 109, 1485–1490.
 

 

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