Carbon Coating on TEM Samples – to Avoid Charging Effect
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. You can click How to Cite This Book to cite this book. Please let Dr. Liao know once you have cited this book so that the brief information of your publication can appear on the “Times Cited” page. This appearance can also help advertise your publication.

 

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The charging effect during TEM observaiton leads to unacceptable microscope instabilities. To avoid charging effect, the TEM specimen can be coated with a thin carbon (C) layer.

 

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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.



 
 
 
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