Contamination Reduction in EM Vacuum
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. How to Cite This Book

 

=================================================================================

Contamination in EM vacuum systems can be reduced by cool-traps, by chemical purging, by using cleaner pumps, by plasma cleaning [1], or by liquid nitrogen-cooled anti-contamination device (ACD) [2].

 

[1] Vane R., Carlino V. Microscopy and microanalysis (2005) Honolulu, Abstract 233.
[2] Vladár, A. E. et al. Proc. SPIE 4344 (2001), p. 835.

 

=================================================================================

The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved