Artifact in Image or Spectrum with High
Probe Current or Analyzing on Mobile Elements
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Modern microscopes normally have very high beam current. However, artifacts can occur at this current density, especially when imaging or scanning on mobile elements. For instance, the standard deviation of signal in the atom intensity can be larger than expected from the counting statistics owing to atom motion between successive scan lines causing distortion of imaging or recording spectra in some spot profiles.

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.



 
 
 
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