Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| In some case, the EM (electron microscopy) images can be displayed with a nonlinear intensity scale to highlight bright features. For example, Figure 4453 (a) and (b) shows raw data (STEM image) with no filtering, smoothing, or interpolation and the same region after filtering to remove the lattice and then the circled Sb (antimony) atoms in Si (silicon) can be identified and counted by the particle counting software.
Figure 4453. (a) Raw data (STEM image); (b) Analyzed data [1].
[1] Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si, P. M. Voyles, D. A. Muller, J. L. Grazul, P. H. Citrin, and H.-J. L. Gossmann, Nature, 416 (2002) 826.
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