
Introduction of Cross Section of Scatterings
 Practical Electron Microscopy and Database 
 An Online Book 

http://www.globalsino.com/EM/

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Cross section of scattering measures the probability that an event occurs, given by,
 [4477]
where N  Events per volume (sites/cm^{3})
n_{i}  Number incident particles per unit area (particles/cm^{2})
n_{t}  Number target sites per volume (sites/cm^{3})
Q has units of cm^{2} and is considered as an effective ‘size’ which the atom presents as a target to incident particles.

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