NiFe
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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NiFe and FeCoN are magnetic materials. NiFe and FeCoN showed [1] more significant grain growth from ~20 to ~500 nm and ~20 to ~100 nm in size, respectively, caused by focused-ion-beam (FIB) milling at a dose of 0.15 nC/µm2. The NiFe films fibbed with the same ion dose ~0.15 nC/µm2 and different beam currents (99, 672, and 1500 pA) experienced similar grain growth, suggesting that the grain growth is driven by momentum transfer rather than local heating. It was also shown that FIB milling induced grain elongation and crystallographic twins in the NiFe films. These twins tended to be parallel to the fast axis of beam rastering, while the axis of elongation, if present, tended to be along slow axis of rastering. For fibbed FeCoN films, no acicular grains or twins were observed. This is believed to be due to the difference in crystal structure and twinning planes of the face-centered-cubic and body-centered-cubic structures.

 

 

[1] Focused-ion-beam induced grain growth in magnetic materials for recording heads, C.-M. Park and J. A. Bain, Journal of Applied Physics, 91(10) (2002) 6830.

 

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