Secondary Electron Detector in TEM/STEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. The sections and pages with a red star (*) or without stars are for basic studies, those with two red stars (**) are at medium level; and those with three red stars (***) are for advanced studies. If you are citing the contents in the book, for instance, please cite them in the format of “Practical Electron Microscopy and Database, Y. Liao, 2006,  pp 4832” for http://www.globalsino.com/EM/page4832.html, or in the format of “Practical Electron Microscopy and Database, Y. Liao, (2006),  http://www.globalsino.com/EM/page4832.html”.

 

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The schematics in Figure 4534 shows the electron optical column in a modern analytical electron microscope operated in STEM mode.

Schematics of the electron optical column in a modern analytical electron microscope operated in STEM mode

Figure 4534. Schematics of the electron optical column in a modern
analytical electron microscope operated in STEM mode.

 

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