|
|
Double Deflection Scan Coils in STEMs
- Practical Electron Microscopy and Database -
- An Online Book -
|
|
https://www.globalsino.com/EM/
|
|
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
|
=================================================================================
The schematics in Figure 4535a shows the electron optical column in a modern analytical electron microscope operated in STEM mode.
Figure 4535a. Schematics of the electron optical column in a modern
analytical electron microscope operated in STEM mode.
Figure 4535b shows the structure of the electron probe-forming system in STEM mode in JEOL JEM-2010F TEMs.
Figure 4535b. Schematic illustration of the probe-forming electron optics in STEM mode in JEOL JEM-2010F TEMs.
|
=================================================================================
The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.
|
|
