Double Deflection Scan Coils in STEMs
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The schematics in Figure 4535a shows the electron optical column in a modern analytical electron microscope operated in STEM mode.

Schematics of the electron optical column in a modern analytical electron microscope operated in STEM mode

Figure 4535a. Schematics of the electron optical column in a modern
analytical electron microscope operated in STEM mode.

Figure 4535b shows the structure of the electron probe-forming system in STEM mode in JEOL JEM-2010F TEMs.

Schematic illustration of the probe-forming electron optics in STEM mode in JEOL JEM-2010F TEMs

Figure 4535b. Schematic illustration of the probe-forming electron optics in STEM mode in JEOL JEM-2010F TEMs.

 

 

 

 

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