Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Double Deflection Scan Coils in STEMs

The schematics in Figure 4535a shows the electron optical column in a modern analytical electron microscope operated in STEM mode.

Schematics of the electron optical column in a modern analytical electron microscope operated in STEM mode

Figure 4535a. Schematics of the electron optical column in a modern
analytical electron microscope operated in STEM mode.

Figure 4535b shows the structure of the electron probe-forming system in STEM mode in JEOL JEM-2010F TEMs.

Schematic illustration of the probe-forming electron optics in STEM mode in JEOL JEM-2010F TEMs

Figure 4535b. Schematic illustration of the probe-forming electron optics in STEM mode in JEOL JEM-2010F TEMs.