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Dependence of Signal Types on Sample Thickness
in EMs (Electron Microscopes)
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Figure 4560 presents the types of major signals generated in a sample of varying thickness by incident electron beam. The different signals are illustrated by different colors.
Figure 4560. The types of major signals generated in a sample of varying thickness by incident electron beam.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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