Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| In point analysis and mapping using EDS, some variation in the spatial resolution is expected with different X-ray lines and overvoltages [1].
[1] C. J. Powell, National Bureau of Standards Special Publication, 1976, 460, 97.
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