Cross Section of Secondary-Electron Generation
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Figure 4613 shows the cross section of secondary-electron generation process in Al as a function of the incident electron energy at the scattering angles of ~ 0°. For comparison, the figure also shows cross sections for the elastic and other inelastic scattering processes.

Cross sections for the various elastic and inelastic scattering processes in Al as a function of the incident electron energy

Figure 4613. Cross sections for the elastic and various inelastic scattering processes in Al as a function of
the incident electron energy at scattering angles of ~ 0°.

 

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