Plasmon Peaks from Thick TEM Samples
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

=================================================================================

For thick TEM samples, an incident electron can excite several plasmons and multiple peaks can occur, for instance, two or more plasmons can be excited by a single primary electron, inducing double and/or triple plasmon peaks in the EELS spectrum.

A thin specimen can avoid multiple scattering which obscures the core-loss edges. That is, the sample should be so thin that the plasmon peak is smaller than one-tenth of the zero loss.

 

=================================================================================

The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved