Radiation Ionization Energy to Form Electron-Hole Pairs in Materials
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, managers, and researchers. The sections and pages with a red star (*) or without stars are for basic studies, those with two red stars (**) are at medium level; and those with three red stars (***) are for advanced studies. If you are citing the contents in the book, for instance, please cite them in the format of “Practical Electron Microscopy and Database, Y. Liao, 2006,  pp 4832” for http://www.globalsino.com/EM/4832.html, or in the format of “Practical Electron Microscopy and Database, Y. Liao, (2006),  http://www.globalsino.com/EM/4832.html”.

 

=================================================================================

 

Figure 4636 and Table 4636 shows the average energy (radiation ionization energy) required to form one electron-hole pair versus bandgap energy for a number of semiconductor materials.

The average energy required to form one electron-hole pair versus bandgap energy for a number of semiconductor materials

Figure 4636. The average energy required to form one electron-hole pair versus bandgap energy for a number of semiconductor materials [1].

Table 4636. Properties of Semiconductor Materials. [1]

  Atomic Number (Z) Band Gap (eV) Energy per e-h Pair (eV)   Best γ-Ray Energy Resolution (FWHM)
Si (300 K) 14 1.12 3.61   -
    1.17 @ 77 K      
Ge (77 K) 32 0.74 2.98   420 eV @ 100 keV
          920 eV @ 660 keV
          1300 eV @ 1330 keV
CdTe (300 K) 48-52 1.47 4.43   3800 eV @ 122 keV
          7500 eV @ 661 keV
HgI2 (300 K) 80-53 2.13 6.5   850 eV @ 6 keV
          3500 eV @ 122 keV
GaAs (300 K) 31-33 1.43 4.2   650 eV @ 60 keV
          2600 eV @ 122 keV

 

[1] Glenn F. Knoll, Radiation Detection and Measurement, Wiley (1979).

=================================================================================

The book editor and authors welcome your comments, suggestions, and papers, please click here for submission. Unless it is specified on the page, the author of the current page is Dr. Liao.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved