Investigation and Quantification of Elemental Segregation at Interface
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Up to date, there are three major techniques used to investigate and quantify the elemental segregation at interfaces, which are energy dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), and the atom probe field ion microscopy (APFIM). Note that APFIM method is very limited to metallic and metal-ceramic interfaces.

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.