Cross Section of High-Angle Scattering of Electrons
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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At angles higher than 50 mrad, we can consider the scattering follows Rutherford’s law, i.e. the scattering cross section is proportional to Z2. For instance, high-angle annular dark-field (HAADF) technique uses this principle to analyze the local chemical composition in materials.

 

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